Signal Integrity issues in designing and testing RF Devices

Speaker: Francesco Raimondi

Company/ Institute: Teledyne LeCroy

Event: 11th work meeting

Date: 8 November 2013

Abstract:

Today requirements in designing and testing RF devices are becoming more challenging because of the increasing complexity and speed of the devices developed. The merging of the analog and digital world is another element. The requirements and competence in the design and testing ask for skills which were confined in two separate competences: RF where the domain of analysis is frequency and baseband where analog and digital competence were essential. Teledyne LeCroy offer unique solutions in characterizing connections between the various components of the RF system, analysis in time domain with unique features and high resolution/high dynamic multichannel spectrum analysis.

Skip to toolbar